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Tohoku Univ. Technology
Admin No.T16-120

Method for creating electron-beam hologram, magnetic filed information measurement method and magnetic field information measuring device

Possible to visualize the effect of electrons when a magnetic field is applied, and observe & evaluate electron/spin distribution!

Overview

 So far, the electron holography has been used to visualize the electric & magnetic fields at nanoscale or the movement of electrons due to charging in various materials. However, it has not been possible to visualize and evaluate how the magnetic field applied to a sample affects the secondary electrons existing on the sample surface or around the sample surface.

 This invention is able to provide a method for creating electron holograms, a method and a device for measuring magnetic field information that can visualize & evaluate the effect of the applied magnetic field on the secondary electrons existing on the sample surface or around the sample surface. This invention is characterized by the creation of an electron beam hologram by interfering an object wave consisting of an electron beam affected by the sample where a magnetic field is applied, and a reference wave consisting of an electron beam which is not affected by the sample.

Method for creating electron-beam hologram, magnetic filed information measurement method and magnetic field information measuring device

Relative change in the magnetic flux density with the increase of applied magnetic fields

Method for creating electron-beam hologram, magnetic filed information measurement method and magnetic field information measuring device

Product Application

・Spintronics device development
・Research of magnetic phenomena in extremely small area
・Research of the relationship between magnetic properties and physiological function of a biological tissue and cel

Related Works

[1] D. Shindo, Z. Akase, Mater. Sci. Eng. R Rep. 142(2020)100564
https://doi.org/10.1016/j.mser.2020.100564

IP Data

IP No.  : JP6786121, US11,067,649
Inventor : SHINDO Daisuke, SATO Takafumi
keyword : Measurement, Machine, Control







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