東北大学技術
整理番号：T11-047
Novel measurement of both surfaces
Measurable < 10 μm thick, Simultaneous, Non-destructive
Conventional Method
This Method
知的財産データ
知財関連番号 ： PCT/JP2011/75369
Novel measurement of both surfaces
Measurable < 10 μm thick, Simultaneous, Non-destructive
知財関連番号 ： PCT/JP2011/75369